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Please use this identifier to cite or link to this item: http://192.168.1.231:8080/dulieusoDIGITAL_123456789/6303
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dc.contributor.authorNguyen Huy Sinh-
dc.date.accessioned2020-06-25T23:49:41Z-
dc.date.available2020-06-25T23:49:41Z-
dc.date.issued2020-
dc.identifier.urihttp://192.168.1.231:8080/dulieusoDIGITAL_123456789/6303-
dc.description.abstractThe enhancement of critical current density (Jc) in the (YBa2Cu3O7-δ(YBCO)/Y2O3) ×N multilayered films was reported. The (YBCO/Y2O3) ×N multilayered films in which N was varied from 0 to 10 were prepared by using the pulsed laser deposition (PLD) technique. Magnetization data measured at 65 K showed that Jcof the (YBCO/Y2O3) ×N multilayered films was enhanced in comparison with that of the pure YBCO film. More interestingly, the Jcenhancement was obtained to increase at small values of N, reach the maximum at N = 5, then decrease with increasing N to 10. The Jcenhancements in the (YBCO/Y2O3) ×N multilayered films with N ≤5 were attributed to the increases in the number of single YBCO layers. The microstructure degradation in the (YBCO/Y2O3) ×N multilayered filmswith N > 5 was likely to be reason for the decreases in their Jc, which was confirmed by using the scanning electron microscopy (SEM) imagesen_US
dc.publisherĐại học Quốc gia Hà Nộien_US
dc.titleEnhancement of Critical Current Density in the (YBa2 Cu3O7-δ/Y 2O3 ) ×N Multilayered Filmsen_US
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