http://192.168.1.231:8080/dulieusoDIGITAL_123456789/17273| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Joseph S. Heyman | - |
| dc.date.accessioned | 2020-12-21T14:34:17Z | - |
| dc.date.available | 2020-12-21T14:34:17Z | - |
| dc.date.issued | 1998 | - |
| dc.identifier.uri | https://www.sciencedirect.com/science/book/9780815511717 | - |
| dc.identifier.uri | http://192.168.1.231:8080/dulieusoDIGITAL_123456789/17273 | - |
| dc.publisher | William Andrew Publishing | - |
| dc.title | Electronics Reliability and Measurement Technology | - |
| Appears in Collections: | Kỹ thuật - Công nghệ | |
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